Solver Nano - AFM Specializat
AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, userfriendly and professional tool.
Solver Nano is designed by the NTMDT SI team that also created High Performance Systems like NTEGRA, NEXT II and NTEGRA Spectra II which have been proven in the scientific community through many key publications.
Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.
These capabilities enable all of the basic AFM techniques in compact SPM design.
Scanner:100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner
AFM resolution:0.01 nm
Environments:Air and liquid measurements.
Combined video optical microscopes:Build in 100x optical USB microscope
Design:Table-top, affordable, robust and user-friendly
High voltage regime:100x100x12 um
Low voltage regime:3x3x3 um
Scanner type:Metrological piezotube XYZ scanner with sensors
Sensors type:XYZ – ultrafast capacitance sensors
Low noise XY sensor:<0.3 nm
Metrological Z sensor:<0.03 nm
Metrological XY sensor:<0.1%
Sensors linearity Metrological Z sensor:<0.1%
Resolution:XY - 0.3 nm, Z - 0.03 nm
Linearity:XY - <0.1%, Z - <0.1%
Sample positioning range:12 mm
Sample positioning resolution:1.5 um
Sample dimension:up to 1,5” X 1,5” X 1/2”, 35x35x12 mm
Sample weight:Z – Stepper Motor
Approach system step size:230 nm
Approach system speed rate:10 mm per min
Algorithm Gentle approach:Available (probe guaranteed to stop before it touches the sample)
AFM head for Si cantilever:Available. All commercial cantilevers can be used
Type of cantilever detection:Laser/Detector Alignment
Probe holders:Probe holder for air measurements. Probe holder for liquid measurements.
Type of AFM head mounting:Cinematically mount. Mount accuracy 150 nm (Remove/mount accuracy)
STM AFM head for wire probes:Available. Tungsten wire for AFM measurement. (low cost experiments)
Number of images can be acquired during one scanning cycle:Up to 16
Image size:Up to 8Kx8K scan size
DSP:Floating point 320 MHz DSP
Digital FB:Yes 6 Channels
DACs:4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage 2 16-bit DAC for user output
High-voltage outputs:X, -X, Y, -Y, Z, -Z at -150 V to +150 V
XY RMS noise in 1000 Hz bandwidth:0.3 ppm RMS
Z RMS noise in 1000 Hz bandwidth:0.3 ppm RMS
XY bandwidth:4 kHz (LV regime – 10 kHz)
Z bandwidth:9 kHz
Maximal current of XY amplifiers:1.5 mA
Maximal current of Z amplifiers:8 mA
Integrated demodulator for X,Y,Z capacitive capacitance sensors:Yes
Open/Closed-loop mode for X,Y controlх:Yes
Generator frequency setting range:DC – 5 MHz
Deflection registration channel bandwidth:170 Hz - 5 MHz
Lateral Force registration channel bandwidth:170 Hz - 5 MHz
2 additional registration channel bandwidth:170 Hz - 5 MHz
Bias Voltage:± 10 V bandwidth 0 – 5 MHz
Number of generators for modulation, user accessible:2, 0-5 MHz, 0.1 Hz resolution
Stepper motor control outputs:Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
Additional digital inputs/ outputs:6
Additional digital outputs:1
I2C bus:Yes
Max. cable length between the controller and SPM base or measuring heads:2 m
Computer interface:USB 2.0
Voltage supply:110/220 V
Power consumption:≤ 110 W