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stainless steel plates*shear resistant pattern*top plate with hole Ø 10 mm*for flexible clamp*no. 2684, 2686*rubber feet

stainless steel plates*shear resistant pattern*easy going movement*assistance (pneumatic springs)*top plate with hole Ø 10 mm*for flexible clamp*no. 2684, 2686*rubber feet

nickel plated brass*with handles*clearing rod*wall thickness 0,4 mm

New construction patented DE 20 2010 006 420*height adjustment by hand or cordless drill: precise,secure, quick*mobile and network-independent operation*integrated safety clutch*stainless steel plates*shear resistant pattern*top plate with Ø 10 mm hole*slip-proof rubber feet*suitable 1/4" bit for cordless drill included in delivery

nickel plated brass*length 250 mm

stainless steel*heavy pattern*graduated

stainless steel*graduated

The FT-NIR spectrometer MPA III is designed to meet the demands of today’s and tomorrow’s quality control. It combines outstanding flexibility and high performance with an easy-to-operate interface. • Full line of sample presentation options for all NIR applications • Software-controlled module selection, no manual exchange required/ • Low cost of ownership thanks to high quality components with long life time • Easy calibration transfer to other Bruker lab, at-line or process spectrometers • Fully cGMP and 21 CFR Part 11 compliant, supports validation according to USP and Ph.Eur 2.2.40

nickel plated brass*length 200 mm

rounded corners

New construction patented DE 20 2010 006 420*height adjustment by hand or cordless drill: precise,secure, quick*mobile and network-independent operation*integrated safety clutch*stainless steel plates*shear resistant pattern*top plate with Ø 10 mm hole*slip-proof rubber feet*suitable 1/4" bit for cordless drill included in delivery

stainless steel*graduated

New construction patented DE 20 2010 006 420*height adjustment by hand or cordless drill: precise,secure, quick*mobile and network-independent operation*integrated safety clutch*stainless steel plates*shear resistant pattern*top plate with Ø 10 mm hole*slip-proof rubber feet*suitable 1/4" bit for cordless drill included in delivery

wood*steel spring*length 180 mm

The external accessory PMA 50 has been specially developed for Polarization Modulation measurements. It can be adapted to Bruker TENSOR, INVENIO and VERTEX FTIR spectrometers. All optic and electronic components in the PMA 50 module are optimized for the Polarization Modulation. Both linear dichroitic measurement techniques like PM-IRRAS and circular dichroitic experiments like VCD spectroscopy can be realized using this dedicated system. The core of the Polarization Modulation technique is the Photoelastic Modulator (PEM) with a nominal modulation frequency of 42 kHz. With the help of the parallel 24-bit dual-channel data acquisition technology the sum and the difference signals can be collected simultaneously with highest sensitivity. The PMA 50 module exhibits short beam path, and therefore provides optimal S/N ratio and stability.

The FTIR spectrometer ALPHA II combines outstanding quality with a small footprint and sets a benchmark in terms of user convenience. With the integrated panel PC and the touch-based operation, FTIR spectroscopy has never been easier. The ALPHA II features a new way to operate an FTIR spectrometer. With the integrated panel PC and the dedicated OPUS-TOUCH user interface it takes only three touches for measurement, evaluation and report generation. OPUS-TOUCH is very intuitive and guides you conveniently through the measurement and evaluation process. Alternatively the ALPHA II can also be operated with an external PC.

stainless steel*for 50 test tubes

Thermogravimetric analysis (TG) follows changes in mass of the sample as a function of temperature and/or time. TG gives characteristic information about the composition of the measured sample, in particular the amounts of the various components and their thermal behavior. In addition, further measurements are possible such as kinetic analysis of thermal decomposition. The identification of gases released directly from the sample or during thermal treatment cannot be performed just by thermal analysis, but coupling a spectroscopic method such as Fourier-Transform-Infrared (FTIR) spectroscopy is an excellent solution. IR spectroscopy is a classical technique, which depends upon the interaction of infrared radiation with the vibrating dipole moments of molecules. It gives, with the exception of homonuclear diatomics and noble gases, a characteristic spectrum for each substance.

SiBrickScan (SBS) is a dedicated at-line system for the FTIR quantification of interstitial Oxygen in complete Silicon ingots, resulting in a concentration profile along the longitudinal axis. Accessing this information without sawing wafers or test samples is a major and cost saving advantage. Get Valuable Information to Check and Optimize Product Quality Knowing the Oxygen gradient of Si ingots enables important conclusions helping e.g. to control and optimize the Silicon crystallization process or to identify batches of bad raw material. Therefore SBS will help to save costs by optimizing product quality and reducing the amount of defective wafers. The random sampling of individual ingots does strongly reduce sample preparation efforts and provides relevant information much earlier.

MATRIX-MF is a rugged and a compact spectrometer that can be fiber optically coupled to measure chemical reactions in laboratory and/or process environments. Bruker's MATRIX-MF FTIR spectrometer expands the proven MATRIX series product line utilizing the information rich mid-IR region for use in both laboratory and process environments. The MATRIX-MF is a process ready FTIR spectrometer that is ideal for real-time monitoring and analysis of chemical and biological reactions.

Innovative, powerful and easy to operate, this and more is BRAVO the handheld Raman spectrometer from Bruker. BRAVO relies on the proven Bruker combination of innovation and quality and combines latest technologies for an unparalleled performance. The patented fluorescence mitigation using Sequentially Shifted Excitation (SSE™) enables the measurement of a much wider range of materials than ever before using handheld Raman spectrometers. Duo LASER™ excitation with two lasers offers the highest sensitivity in a large spectral range from 300 cm-1 to 3200 cm-1 including the CH-stretching vibrations. Furthermore, BRAVO supports the most efficient and clearly laid-out workflow on a large 7 inch touch screen display. This and many more form the basis of a unique product especially designed for raw material verification of finished products in the pharmaceutical industry.

The SENTERRA II defines a new level of spectroscopic performance and user friendliness in the class of compact Raman microscopes. SENTERRA II is designed to deliver excellent sensitivity combined with high spectral and imaging performance. Therefore the SENTERRA II is a powerful platform for advanced research applications. Due to its high degree of automation, compact size and efficient workflow the SENTERRA II is likewise an ideal tool for solving real world tasks in the quality control laboratory. Its unprecedented permanent stability of the wavenumber axis guarantees precise and accurate results at every time. The SENTERRA II is THE Raman microscope for both, the multi-user environment with high daily throughput and for the lab working at the forefront of scientific research.

The intuitive, easy-to-use OPUS software controls all data collection and manipulation functions for the MultiRAM. The real-time spectrum display permits software control of the analysis conditions, including optimization of the laser power and the sample position. High Performance Combine advanced digital electronics with Bruker Optics’ high quality optics and you have the ultimate in a high performance FT-Raman system. The heart of the MultiRAM is Bruker Optics’ patented interferometer with gold coated optics and permanent RockSolid alignment, which provides the superb stability and throughput required for demanding emission experiments.

stainless steel*conical*graduated

stainless steel*finger grip*length 130 mm*up to 30 mm Ø

stainless steel plates*shear resistant pattern

The award winning MATRIX-F II FT-NIR spectrometer allows the direct measurement in process reactors and pipelines, leading to a better understanding and control of the process. Accurate in-line results in seconds Multiple components per measurement Non-destructive analysis Optional built-in 6-port multiplexer Direct method transfer Rugged design Ethernet connectivity and industry standard communication protocols

FTIR Excellence for Industry, R&D and Science: INVENIO INVENIO is the definitive spectroscopic solution for routine FTIR analysis as well as research and development. It is all you need and so much more: innovative technologies, intelligent design and its new beam path contribute to an unrivalled user experience. Your advantage: •Outstanding signal-to-noise ratio •Broad spectral range (FIR, MIR, NIR and VIS/UV) •Touch-PC with dedicated software for enhanced productivity •MultiTect™: Up to seven automated and software controlled internal detectors •Transit™: parallel availability of two experimental setups •RockSolid™: reliable, well-proven and precise •CenterGlow™ IR source: optimized light flux and durability •Bruker FM: MIR and FIR spectra in one go •Upgradability: retrofit spectral range extensions or time resolved measurements •Multiple beam inputs and outputs •Compact footprint optimized for laboratory benches

The LUMOS II offers outstanding visual and spectral data quality with full automation of all measurement modes: transmission, reflection and ATR. For FTIR beginners and experts alike, the LUMOS II is the best solution for infrared microscopy. Bruker's exclusive Focal Plane Array (FPA) detector technology allows you to experience detailed imaging at the maximum speed. This allows you to take full advantage of the vast possibilities offered by FT-IR microscopy. The OPUS IR software provides you with assistance whenever you need it and allows you to glide effortlessly through measurement, evaluation and reporting. Your advantages: • Extremely fast FT-IR imaging (FPA) • High spectral quality and resolution • Brilliant visual images and huge field of view • Fully automated FT-IR microscope • Integrated, piezo-controlled ATR crystal • Software supported measurement and evaluation • Automatic measurement in transmission, reflection and ATR

The IFS 125HR is the ultimate instrument for the high resolution IR spectroscopy Outstanding results in your laboratory In absorption or emission mode, the IFS 125HR can resolve highly complex spectra into discrete lines for recognition and spectral assignment. Outstanding resolution across the entire spectrum Resolved linewidths of < 0.0009cm -1 Broad spectral range: from 5cm -1 in the far-IR to >50,000cm -1 in the UV Double-sided interferogram acquisition (option) Symmetric line shapes - due to high precision optics Easy range change - every experiment can access different sources and detectors without breaking vacuum. A total of 4 sources and 6 detectors can be accessed through each of two different sample compartments